Conference Board:
QingPing YANG, Brunel University of London, UK (Chair)
Alistair FORBES, National Physical Laboratory, UK (Co-Chair)
Abdérafi CHARKI, Université d’Angers, France (Co-Chair)
Yanfu LI, Tsinghua University, China (Co-Chair)
Binrui WANG, China Jiliang University, China (Co-Chair)
International Program Committee Co-Chairs:
Valerie LIVINA, National Physical Laboratory, UK
Marc HIMBERT, LNE-INM/CNAM Laboratoire National de métrologie et d’Essais, France
Wenyi LIU, North University of China, China
Qiang WANG, China Jiliang University, China
International Program Committee Members:
Faris ALWZINANI, Brunel University of London, UK
Honggen CHEN, Zhengzhou University of Aeronautics, China
Fuwen HU, North China University of Technology, China
Tianjian LI, University of Shanghai for Science and Technology, China
Feng LIU, Tianjin University, China
Xianping LIU, Warwick University, UK
Yohan NOH, Brunel University of London, UK
Nadeem QAZI, University of East London, UK
Qunfen QI, University of Bristol, UK
Mohd Rizal Bin SALLEH, Universiti Teknikal Malaysia Melaka, Malaysia
Thammarat SOMTHONG, Thailand National Institute of Metrology, Thailand
Valentina STOJCESKA, Brunel University of London, UK
Changjing SUN, China Jiliang University, China
Wenjuan SUN, KU Leuven, Belgium
Mark SUTCLIFFE, TWI, UK
Qijian TANG, Shenzhen University, China
Zdenek VINTR, University of Defense, Czech Republic
Fang WANG, Brunel University of London, UK
Hong WEI, University of Reading, UK
Decheng WEN, Shandong University, China
Bin ZHANG, Brunel University of London, UK
Tao ZHANG, Warwick University, UK
Juan ZHOU, China Jiliang University, China
Yanping ZHU, Changzhou University, China
Advisory Committee:
Barry JONES, Brunel University of London; IET (former Vice President), UK
Pete LOFTUS, Evalu8ion Ltd; University of Edinburgh; RCNDE; Sensing Innovation Leadership Council, UK
Ian NICHOLSON, TWI, UK
Scott PHILLPS, Autodesk, UK
Hans RABUS, PTB, Germany
Lee STOKES, MACE, UK
Scientific Committee:
Mokhtar ATTARI, University of Science and Technology Houari Boumediene (USTHB), Algeria
Priyanka BHARTI, National Physical Laboratory, UK
Abdérafi CHARKI, Université d’Angers, France
Honggen CHEN, Zhengzhou University of Aeronautics, China
Alistair FORBES, National Physical Laboratory, UK
Ariana FUGA, EDP Sciences, France
Peipei GAO, Nankai University, China
Thong Ngee GOH, National University of Singapore, Singapore
Hong-Zhong HUANG, University of Electronic Science and Technology of China, China
Marc HIMBERT, LNE-INM/CNAM Laboratoire National de métrologie et d’Essais, France
Argiris LASKARAKIS, Aristotle University of Thessaloniki, Greece
Feng LIU, Tianjin University, China
Jian LIU, The University of Arizona, USA
Wenyi LIU, North University of China, China
Yuanyuan LIU, Science Press; EDP Sciences, China
Valerie LIVINA, National Physical Laboratory, UK
Emanuela NATALE, The Università dell’Aquila, Italy
Seung-Nam PARK, Korea Research Institute of Standards and Science, South Korea
Qunfen QI, University of Bristol, UK
Prem K. RACHAKONDA, National Institute of Standards and Technology (NIST), Gaithersburg, USA
Vishal RAMNATH, University of South Africa, Republic of South Africa
Paul J. SCOTT, University of Huddersfield, UK
Changjing SUN, China Jiliang University, China
Marie-France THEVENON, University of Montpellier – CIRAD, France
Zdenek VINTR, University of Defense, Czech Republic
Qiang WANG, China Jiliang University, China
Decheng WEN, Shandong University, China
Juan ZHOU, China Jiliang University, China
Regional Chairs:
Mokhtar ATTARI, University of Science and Technology Houari Boumediene (USTHB), Algeria
Thong Ngee GOH, National University of Singapore, Singapore
Hong-Zhong HUANG, University of Electronic Science and Technology of China, China
Jian LIU, The University of Arizona, USA
Emanuela NATALE, University of L’Aquila, Italy
Xiangjun WANG, Tianjin University, China
Publishing and Promotion Committee:
Aliénor DECOURS-PEREZ, Publisher of the International Journal of Metrology and Quality Engineering (IJMQE), EDP Sciences, France
Lena KOUNOVSKY, Publisher of the International Journal of Metrology and Quality Engineering (IJMQE), EDP Sciences, France
Ariana FUGA, Publisher of the European Physical Journal Applied Physics (EPJ AP), EDP Sciences, France
Yuanyuan LIU, Publisher of Security and Safety (S&S), Science Press; EDP Sciences, China
Local Organising Committee:
QingPing YANG, Brunel University of London, UK (Chair)
Priyanka BHARTI, National Physical Laboratory, UK
Xinli DU, Brunel University of London, UK
Hongying MENG, Brunel University of London, UK
Nila NILAVALAN, Brunel University of London, UK
Yohan NOH, Brunel University of London, UK
Xizhi SUN, Brunel University of London, UK
Fang WANG, Brunel University of London, UK
Bin ZHANG, Brunel University of London, UK